Axial Divergence in a Conventional X-ray Powder Diffractometer. II. Realization and Evaluation in a Fundamental-Parameter Profile Fitting Procedure

Journal of Applied Crystallography

Volumn 31, Issue 6, 1998, Pages 862-868

  Cheary, R W ^a   Coelho, A A ^a  

^a UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000793089     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889898006888     Document Type: Article

References (16)

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