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Volumn 13, Issue 2, 1998, Pages 100-106

An experimental investigation of the effects of axial divergence on diffraction line profiles

Author keywords

Axial divergence; Line profile analysis; X ray diffractometers

Indexed keywords

DIFFRACTION;

EID: 0032383854     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1017/S0885715600009933     Document Type: Article
Times cited : (8)

References (10)
  • 1
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    • Study of the Cu Kα emission spectrum
    • Berger, H. (1986). "Study of the Cu Kα Emission Spectrum," X-Ray Spectrom. 15, 241-243.
    • (1986) X-ray Spectrom , vol.15 , pp. 241-243
    • Berger, H.1
  • 2
    • 0026852338 scopus 로고
    • A fundamental parameters approach to line profile fitting
    • Cheary, R. W., and Coelho, A. A. (1992). "A Fundamental Parameters Approach to Line Profile Fitting," J. Appl. Crystallogr. 25, 109-121.
    • (1992) J. Appl. Crystallogr. , vol.25 , pp. 109-121
    • Cheary, R.W.1    Coelho, A.A.2
  • 3
    • 0005470927 scopus 로고
    • An analysis of the effect of different instrumental conditions on the shapes of X-ray powder line profiles
    • Cheary, R. W., and Cline, J. P. (1995). "An Analysis of the Effect of Different Instrumental Conditions on the Shapes of X-ray Powder Line Profiles," Adv. X-Ray Anal. 38, 75-82.
    • (1995) Adv. X-ray Anal. , vol.38 , pp. 75-82
    • Cheary, R.W.1    Cline, J.P.2
  • 4
    • 84876626065 scopus 로고    scopus 로고
    • Characterisation and modelling of peak shifts in conventional powder diffractometry
    • in press
    • Cheary, R. W., Cline, J. P., and Anast, M. (1996). "Characterisation and Modelling of Peak Shifts in Conventional Powder Diffractometry," Adv. X-Ray Anal. (in press).
    • (1996) Adv. X-ray Anal.
    • Cheary, R.W.1    Cline, J.P.2    Anast, M.3
  • 5
    • 0028746205 scopus 로고
    • A correction of powder diffraction peak asymmetry due to axial divergence
    • Finger, L. W., Cox, D. E., and Jephcoat, A. P. (1994). "A Correction of Powder Diffraction Peak Asymmetry due to Axial Divergence," J. Appl. Crystallogr. 27, 892-900.
    • (1994) J. Appl. Crystallogr. , vol.27 , pp. 892-900
    • Finger, L.W.1    Cox, D.E.2    Jephcoat, A.P.3
  • 8
    • 0002950056 scopus 로고
    • Analytical profile fitting of X-ray powder diffraction profiles
    • edited by R. A. Young (International Union of Crystallography, Oxford University Press, New York)
    • Snyder, R. L. (1993). "Analytical Profile Fitting of X-ray Powder Diffraction Profiles," in The Rietveld Method, edited by R. A. Young (International Union of Crystallography, Oxford University Press, New York), pp. 115-119.
    • (1993) The Rietveld Method , pp. 115-119
    • Snyder, R.L.1
  • 10
    • 84876625703 scopus 로고
    • Accuracy in methods of lattice parameter measurement
    • National Bureau of Standards Special Publication No. 567 (US GPO, Washington. DC)
    • Wilson, A. J. C. (1980). "Accuracy in Methods of Lattice Parameter Measurement," in Accuracy in Powder Diffraction, National Bureau of Standards Special Publication No. 567 (US GPO, Washington. DC), pp. 325-352.
    • (1980) Accuracy in Powder Diffraction , pp. 325-352
    • Wilson, A.J.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.