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Volumn 275, Issue 1-2, 1996, Pages 8-11
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Conversion electron Mössbauer spectroscopy study of iron disilicide films grown by MBE
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Author keywords
Iron; Molecular beam epitaxy; M ssbauer spectroscopy; Silicides
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Indexed keywords
ATOMS;
CRYSTAL DEFECTS;
ELECTRONIC PROPERTIES;
EPITAXIAL GROWTH;
IRON COMPOUNDS;
MOLECULAR BEAM EPITAXY;
MOSSBAUER SPECTROSCOPY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SCANNING TUNNELING MICROSCOPY;
STOICHIOMETRY;
SUBSTRATES;
X RAY PHOTOELECTRON SPECTROSCOPY;
CONVERSION ELECTRON MOSSBAUER SPECTROSCOPY;
FRACTIONAL SITE POPULATIONS;
IRON DISILICIDE FILMS;
MOSSBAUER PARAMETERS;
QUADRUPOLE COUPLING;
STOICHIOMETRIC ELECTRON GUN CODEPOSITION;
THIN FILMS;
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EID: 0030123413
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/0040-6090(95)07008-7 Document Type: Article |
Times cited : (31)
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References (20)
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