Comparative study of methods for measuring the apparent barrier height on an atomic scale

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Olesen, L ^a   Laegsgaard E ^a   Stensgaard, I ^a   Besenbacher, F ^a  

^a AARHUS UNIVERSITY   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE VALUES; ATOMIC SCALE; AU(110); BARRIER HEIGHTS; COMPARATIVE STUDIES; LATERAL VARIATIONS; SCANNING TUNNELING MICROSCOPES; TIP-SAMPLE DISTANCE; UNIT CELLS;

WIND TUNNELS;

EID: 0042176878     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051121     Document Type: Article

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13. Mono-atomic step heights have been used to calibrate the z-scale of the STM
14. ap(between)
15. -1
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17. t/ are performed by pointing and clicking with the mouse during acquisition of a constant-current image
18. t
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