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Journal of Electron Spectroscopy and Related Phenomena

Volumn 88-91, Issue , 1998, Pages 533-538

Dimer structure of clean Si(001) surface studied by grazing-incidence back-scattering MEED

(9) Abukawa, T a,b Shimatani, T a,b Kimura, M a,b Takakuwa, Y a,b Muramatsu, N a,b Hanano, T a,b Goto, T a,b Huff, W R A a,b Kono, S a,b

a TOHOKU UNIVERSITY (Japan)

b UNIVERSITY OF TOKYO (Japan)

Author keywords

Electron diffraction; MEED; Si dimers; Si(001) surface; Surface structure analysis

Indexed keywords

EID: 0000708856 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/s0368-2048(97)00270-3 Document Type: Article

Times cited : (5)

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