메뉴 건너뛰기




Volumn 57, Issue 19, 1998, Pages 12410-12420

Compositional ordering in SiGe alloy thin films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000623885     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.57.12410     Document Type: Article
Times cited : (20)

References (33)
  • 4
    • 33744639624 scopus 로고
    • José Luís Martins and Alex Zunger, Phys. Rev. Lett. 56, 1400 (1986).
    • (1986) Phys. Rev. Lett. , vol.56 , pp. 1400
  • 22
    • 0003472812 scopus 로고
    • Addison-Wesley, Reading, MA
    • B.E. Warren, X-ray Diffraction (Addison-Wesley, Reading, MA, 1969).
    • (1969) X-ray Diffraction
    • Warren, B.1
  • 30
    • 0003472812 scopus 로고
    • Addison-Wesley, Reading, MA
    • For a discussion of the bulk integrated intensity and structural order parameter determination, see B. E. Warren, X-ray Diffraction (Addison-Wesley, Reading, MA, 1969).
    • (1969) X-ray Diffraction
    • Warren, B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.