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Volumn 85, Issue 1, 1999, Pages 432-438
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Sizing particles on substrates. a general method for oblique incidence
a
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000609031
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.369403 Document Type: Article |
Times cited : (22)
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References (29)
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