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Volumn 35, Issue 3, 1996, Pages 858-869

Modeling of light scattering by submicrometer spherical particles on silicon and oxidized silicon surfaces

Author keywords

Angle resolved; Light scatter; Modeling; Submicrometer polystyrene latex spheres

Indexed keywords


EID: 0004183772     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.600664     Document Type: Article
Times cited : (8)

References (19)
  • 1
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    • Hirleman, E.D.1    Oechsle, V.2    Chigier, N.A.3
  • 3
    • 4243182628 scopus 로고
    • Light scattering by submicron spherical particles on semiconductor surfaces
    • K. L. Mittal, Ed., Plenum, New York
    • E. J. Bawolek and E. D. Hirleman, "Light scattering by submicron spherical particles on semiconductor surfaces," in Particles on Surfaces 3, Detection, Adhesion and Removal, K. L. Mittal, Ed., pp. 91-105, Plenum, New York (1991).
    • (1991) Particles on Surfaces 3, Detection, Adhesion and Removal , pp. 91-105
    • Bawolek, E.J.1    Hirleman, E.D.2
  • 5
    • 84975635961 scopus 로고
    • Light scattering signatures of individual spheres on optically smooth conducting surfaces
    • D. C. Weber and E. D. Hirleman, "Light scattering signatures of individual spheres on optically smooth conducting surfaces," Appl. Opt. 27, 4019-4026 (1988).
    • (1988) Appl. Opt. , vol.27 , pp. 4019-4026
    • Weber, D.C.1    Hirleman, E.D.2
  • 6
    • 0023537650 scopus 로고
    • Light scattering by polystyrene spheres on a mirror
    • K. B. Nahm and W. L. Wolfe, "Light scattering by polystyrene spheres on a mirror," Proc. SPIE 675, 295-304 (1986).
    • (1986) Proc. SPIE , vol.675 , pp. 295-304
    • Nahm, K.B.1    Wolfe, W.L.2
  • 7
    • 84975659916 scopus 로고
    • Light-scattering models for spheres on a conducting plane: Comparison with experiment
    • K. B. Nahm and W. L. Wolfe, "Light-scattering models for spheres on a conducting plane: comparison with experiment," Appl. Opt. 26, 2995-2999 (1987).
    • (1987) Appl. Opt. , vol.26 , pp. 2995-2999
    • Nahm, K.B.1    Wolfe, W.L.2
  • 8
    • 0017024438 scopus 로고
    • Low-scatter mirror degradation by particle contamination
    • R. P. Young, "Low-scatter mirror degradation by particle contamination," Opt. Eng. 15, 516-520 (1976).
    • (1976) Opt. Eng. , vol.15 , pp. 516-520
    • Young, R.P.1
  • 10
    • 0000187630 scopus 로고
    • Scattering of electromagnetic radiation by a large, absorbing sphere
    • J. V. Dave, "Scattering of electromagnetic radiation by a large, absorbing sphere," IBM J. Res. Develop. 13, 302-313 (1969).
    • (1969) IBM J. Res. Develop. , vol.13 , pp. 302-313
    • Dave, J.V.1
  • 13
    • 0026370278 scopus 로고
    • Laser alignment modeling using rigorous numerical simulations
    • G. L. Wojcik, D. Vaughan, J. Mould, F. Leon, Q. Qian, and M. Lutz, "Laser alignment modeling using rigorous numerical simulations," Proc. SPIE 1463, 292-297 (1991).
    • (1991) Proc. SPIE , vol.1463 , pp. 292-297
    • Wojcik, G.L.1    Vaughan, D.2    Mould, J.3    Leon, F.4    Qian, Q.5    Lutz, M.6
  • 16
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    • Weidlinger Associates, Private Communication
    • J. Mould, Jr., Weidlinger Associates, Private Communication (1994).
    • (1994)
    • Mould Jr., J.1
  • 18
    • 5844308498 scopus 로고
    • Light scattering by sub-half micron spherical particles on silicon and oxidized silicon surfaces
    • T. Waring, Ed. Mechanical Engineering Publications Ltd., London
    • E. J. Bawolek and E. D. Hirleman, "Light scattering by sub-half micron spherical particles on silicon and oxidized silicon surfaces," in The Future Practice of Contamination Control, T. Waring, Ed. pp. 485-491, Mechanical Engineering Publications Ltd., London (1992).
    • (1992) The Future Practice of Contamination Control , pp. 485-491
    • Bawolek, E.J.1    Hirleman, E.D.2
  • 19
    • 5844426202 scopus 로고
    • A polarization diversity surface analysis system
    • R. G. Knollenberg, "A polarization diversity surface analysis system," Proc. SPIE 774, 32-40 (1987).
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    • Knollenberg, R.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.