Metallic particle sizing on flat surfaces: Application to conducting substrates

Applied Physics Letters

Volumn 68, Issue 22, 1996, Pages 3087-3089

  Moreno, F ^a   Saiz, J M ^a   Valle, P J ^a   Gonzalez F ^a  

^a UNIVERSITY OF CANTABRIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; LIGHT SCATTERING; MATHEMATICAL MODELS; METALS; PARTICLES (PARTICULATE MATTER); PHOTODIODES; POLARIZATION; POSITION MEASUREMENT; SIZE DETERMINATION;

EXTINCTION THEOREM METHOD; FLAT SURFACES; FRESNEL REFLECTION; INVERSE SCATTERING; METALLIC PROTUBERANCES; MICROSIZING; PHASE DIFFERENCE;

SURFACES;

EID: 0030146212     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116431     Document Type: Article

References (10)

1. N. García and M. Nieto-Vesperinas, Phys. Rev. Lett. 71, 3645 (1993), and references therein.
2. J. A. Ogilvy, Theory of Wave Scattering from Random Rough Surfaces (Hilger, Bristol, 1991).
3. R. P. Young, Opt. Eng. INS 15, 516 (1976).
4. P. Lilienfeld, Aerosol Sci. Tehnol. 5, 145 (1986).
5. A. J. Pidduck, D. J. Robbins, I. M. Young, A. G. Cullis, and A. S. R. Martin, Mater. Sci. Eng. INS 134, 417 (1989).
6. K. B. Nahm and W. L. Wolfe, Appl. Opt. AIP 26, 2995 (1987).
7. P. J. Valle, F. González, and F. Moreno, Appl. Opt. AIP 33, 512 (1994).
8. P. W. Barber and S. C. Hill, Light Scattering by Particles: Computational Methods (World Scientific, Singapore, 1990).
9. F. Moreno, F. González, J. M. Saiz, P. J. Valle, and D. L. Jordan, J. Opt. Soc. Am. A AIP 10, 141 (1993).
10. J. M. Saiz, P. J. Valle, F. González, F. Moreno, and D. L. Jordan, Opt. Eng. INS 33, 1261 (1994).