Analysis of scanning probe used for simultaneous measurement of tunneling current and surface potential

Journal of Applied Physics

Volumn 86, Issue 12, 1999, Pages 7087-7093

  Oyama, Yutaka ^a   Majima, Yutaka ^a   Iwamoto, Mitsumasa ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000566425     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371796     Document Type: Article

References (14)

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