In situ scanning tunneling microscopic and spectroscopic investigation of magnetron-sputtered C and CN thin films

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 7, 2000, Pages 4898-4903

  Lin, Nian ^a   Hellgren, Niklas ^a   Johansson, Mats P ^a   Hultman, Lars ^a   Erlandsson, Ragnar ^a   Sundgren, Jan Eric ^a  

^a CHALMERS UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000555960     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.4898     Document Type: Article

References (16)

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