The structural, chemical, and electronic properties of a stable GaS/GaAs interface

Journal of Applied Physics

Volumn 86, Issue 12, 1999, Pages 6940-6944

  Cao, X A ^a,b   Hu, H T ^b   Dong, Y ^b   Ding, X M ^b   Hou, X Y ^b  

^a University of Florida   (United States)

^b FUDAN UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000554186     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.371776     Document Type: Article

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