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Journal of Crystal Growth

Volumn 173, Issue 1-2, 1997, Pages 51-56

Gallium sulfide thin film grown on GaAs(1 0 0) by microwave glow discharge

(7) Chen, Xi Ying a Hou, Xiao Yuan a Cao, Xian An a Ding, Xun Min a Chen, Liang Yao a Zhao, Guo Qing a Wang, Xun a

a FUDAN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; FILM GROWTH; GLOW DISCHARGES; OPTICAL VARIABLES MEASUREMENT; PERMITTIVITY MEASUREMENT; POLYCRYSTALLINE MATERIALS; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR GROWTH; SULFUR COMPOUNDS; X RAY CRYSTALLOGRAPHY;

GALLIUM SULFIDE; MICROWAVE GLOW DISCHARGES;

SEMICONDUCTING FILMS;

EID: 0031546940 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(96)00808-1 Document Type: Article

Times cited : (19)

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