Noise characterization of sputtered amorphous carbon films

Journal of Applied Physics

Volumn 88, Issue 9, 2000, Pages 5482-5484

  Hastas, N A ^a   Dimitriadis, C A ^a   Panayiotatos, Y ^a   Tassis, D H ^a   Patsalas, P ^a   Logothetidis, S ^a  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000511578     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1317234     Document Type: Article

References (10)

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