Microstructural control of (Ca,Sr)RuO3 electrode and the related properties of (Ba,Sr)TiO3 thin films

Journal of the Korean Physical Society

Volumn 32, Issue 4 SUPPL., 1998, Pages

  Son, Seung Young ^a   Kim, Boum Seock ^a   Choi, Duck Kyun ^a   Lee, Kong Soo ^a   Dai, Z R ^b   Ohuchi, Fumio S ^b  

^a Hanyang University   (South Korea)

^b UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000501103     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (10)

1. J. F. Scott, L. Kammerdiner, M. Parris, S. Tryner, V. Ottenbacher, A. Shawabkch and W. F. Oliver, Appl. Phys. 64, 787 (1988).
2. S. Yamamichi, T. Sakuma, K. Takemura and Y. Miyasaka, Jpn. J. Appl. Phys. 30, 2193 (1993).
3. S. H. Pack, J. H. Won, K. S. Lee, J. S. Choi and C. S. Park, Jpn. J. Appl. Phys. 35, 57572 (1996).
4. H. N. Al-Shareef, K. D. Fifford, P. D. Hren, S. H. Rou, O. Auciello and A. I. Kingon, 4th International Symposium on Integrated Ferroelectrics 2, 181 (1992).
5. D. P. Vijaly and S. B. Desu, J. Electrochem. Soc. 140, 2640 (1993).
6. K. Takemura, T. Sakuma and Y. Miyasaka, Appl. Phys. Lett. 64, 2967 (1994).
7. S. D. Bernstein, T. Y. Wong, Y. Kisler and R. W. Tustison, J. Mater. Res. 8, 12 (1993).
8. C. B. Eom, R. J. Cava, R. M. Fleming, Julia M. Phillips, R. B. Van Dorver, J. H. Marshall, J. W. P. Hsu, J. J. Krajewski and W. F. Peck, Jr., Science 258, 1766 (1992).
9. S. K. Hong, H. J. Kim and H. G. Yang, J. Appl. Phys. 80, 822 (1996).
10. K. Abe and S. Komatsu, Jpn. J. Appl. Phys. 33, 5297 (1994).