Junction sharpness in field-induced transistor structures in CuxAg1-xInSe2

Journal of Applied Physics

Volumn 79, Issue 9, 1996, Pages 7370-7372

  McAlpine, N S ^a   McConville, P ^a   Haneman, D ^a   Chernyak, L ^b   Cahen, D ^b  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000968287     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361453     Document Type: Article

References (9)

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