Novel scanning probe microscope for local elasticity measurement

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 35, Issue 7 PART A, 1996, Pages

  Yamada, Ryo ^a   Ye, Shen ^a   Uosaki, Kohei ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

Atomic force microscope; Elasticity; Force curve; Quartz crystal resonator; Scanning probe microscope; Surface

Indexed keywords

CRYSTAL OSCILLATORS; ELASTICITY; FREQUENCY STABILITY; GOLD; IMAGING TECHNIQUES; MECHANICAL VARIABLES MEASUREMENT; MICROSCOPIC EXAMINATION; NATURAL FREQUENCIES; PHOTODETECTORS; POLYMERS; SCANNING; SURFACES;

ATOMIC FORCE MICROSCOPES; ELASTICITY MEASUREMENT; FORCE CURVE; FREQUENCY SHIFT; QUARTZ CRYSTAL OSCILLATOR; SCANNING PROBE MICROSCOPE;

MICROSCOPES;

EID: 0030193970     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.l846     Document Type: Article

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