Growth behavior of carbon nanotubes on Fe-deposited (001) Si substrates

Applied Physics Letters

Volumn 78, Issue 20, 2001, Pages 3130-3132

  Sohn, Jung Inn ^a   Choi, Chel Jong ^a   Lee, Seonghoon ^a   Seong, Tae Yeon ^a  

^a Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000387703     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1371787     Document Type: Article

References (14)

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11. The rough surface of the film [Fig. 3(a)] is due to "ion milling" for TEM specimen preparation. TEM measurements showed that the Fe films varied from ∼0.6 to ∼80 nm in thickness, as the deposition time increased from 20 s to 20 min.
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