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0012278991
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Similar studies have been carried out for laser-focused sodium deposition; however, those results are not directly comparable to the present studies using chromium. See R. E. Behringer, V. Natarajan, and G. Timp, Opt. Lett. 22, 114 (1997)
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special issue on the mechanical effects of light
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10
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18444390006
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special issue on laser cooling and trapping of atoms
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ibid. 6 (1989), special issue on laser cooling and trapping of atoms, edited by S. Chu and C. Wieman;
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84975607732
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16
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18444402516
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note
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The paraxial approximation applies when trajectories have small angles and travel close to the axis, i.e., when dy/dz ≪1 and ky≪1.
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18
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18444388033
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note
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In the experiments the temperature of the oven was different for different runs, ranging from 1800 to 1900 K, with an uncertainty of approximately 50 K. This amount of deviation has only a very minor effect on the outcome of the calculations.
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19
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18444406911
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note
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-2, from which the expression for the full-width at half maximum is derived.
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20
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12044258980
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P. Marte, R. Dum, R. Taïeb, P. D. Lett, and P. Zoller, Phys. Rev. Lett. 71, 1335 (1993).
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Marte, P.1
Dum, R.2
Taïeb, R.3
Lett, P.D.4
Zoller, P.5
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23
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18444397507
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note
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This has been verified by model calculations based on a two-level atom.
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26
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16944362794
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R. E. Scholten, R. Gupta, J. J. McClelland, R. J. Celotta, M. S. Levenson, and M. G. Vangel, Phys. Rev. A 55, 1331 (1997).
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Scholten, R.E.1
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Celotta, R.J.4
Levenson, M.S.5
Vangel, M.G.6
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27
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18444406619
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note
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A protective layer of PMMA (KTI Chemicals, Inc. 950K) was painted on the area of Cr that was not to be etched and cured at 100°C for 1 h. The sample was then dipped in a Cr etchant (Cyantek CR-7) for 60 s at 25°C and rinsed with distilled water. This left a step edge that had a transition width (10-90%) of 15 nm. N.B. certain commercial materials are identified in order to adequately specify the experimental procedure. Such identification does not imply recommendation or endorsement by the National Institute of Standards and Technology, nor does it imply that the materials identified are necessarily the best for the purpose.
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18444361872
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note
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The AFM tips used were commercially available etched silicon tapping-mode tips with nominal specifications 35° cone angle and 10 nm radius. On examining these tips with our artifact, we observed a noteworthy behavior. Under our scan conditions on the Cr samples, the tips became slightly dulled after about 10 min of scanning, reaching a steady-state shape with 25 nm radius and 50° cone angle. This dulling behavior was quite reproducible with a number of tips examined, and the shape appeared to be quite constant after the initial dulling period. We used this dulled shape as our tip model for eroding the data.
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30
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18444402839
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note
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2 images which are taken to be representative of the sample.
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31
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18444392761
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note
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Intensity values presented in this paper have an associated uncertainty of approximately 10%, resulting predominantly from uncertainty in the measurement of laser power.
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32
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0039672731
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Electronic Packaging Material Science III, edited by R. Jaccodine, K. A. Jackson, and R. C. Sundahl, Materials Research Society, Pittsburgh
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D. Goyal, A. H. King, and J. C. Bilello, in Electronic Packaging Material Science III, edited by R. Jaccodine, K. A. Jackson, and R. C. Sundahl, MRS Symposia Proceedings No. 108 (Materials Research Society, Pittsburgh, 1988), p. 395.
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Goyal, D.1
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Bilello, J.C.3
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