Polymerized carbon nanobells and their field-emission properties

Applied Physics Letters

Volumn 75, Issue 20, 1999, Pages 3105-3107

  Ma, Xucun ^a   Wang, Enge ^a   Zhou, Wuzong ^b,e   Jefferson, David A ^b   Chen, Jun ^c   Deng, Shaozhi ^c   Xu, Ningsheng ^c   Yuan, Jun ^d  

^a INSTITUTE OF PHYSICS   (China)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c SUN YAT SEN UNIVERSITY   (China)

^d UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^e UNIVERSITY OF ST ANDREWS   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000268476     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125245     Document Type: Article

References (20)

1. S. Iijima, Nature (London) 354, 56 (1991).
2. W. A. de Heer, A. Chatelain, and D. A. Ugarte, Science 270, 1179 (1995).
3. A. G. Rinzler, J. H. Hafner, P. Nikolaev, L. Lou, S. G. Kim, D. Tomanek, P. Nordlander, D. T. Colbert, and R. E. Smalley, Science 269, 1550 (1995).
4. Q. H. Wang, T. D. Corrigan, J. Y. Dai, R. P. H. Chang, and A. R. Krauss, Appl. Phys. Lett. 70, 3308 (1997).
5. Q. H. Wang, A. A. Setlur, J. M. Lauerhaas, J. Y. Dai, E. W. Seelig, and R. P. H. Chang. Appl. Phys. Lett. 72, 2912 (1998).
6. Y. Chen, S. Patel, Y. Ye, D. T. Shaw, and L. Guo, Appl. Phys. Lett. 73, 2119 (1998).
7. J. M. Bonard, T. Stockli, F. Maier, W. A. de Heer, A. Chatelain, J. P. Salvetat, and L. Forro, Phys. Rev. Lett. 81, 1441 (1998).
8. M. Terrones, A. M. Benito, C. Manteca Diego, W. K. Hsu, O. I. Osman, J. P. Hare, D. G. Reid, H. Terrones, A. K. Cheetham, K. Prassides, H. W. Kroto, and D. R. M. Walton, Chem. Phys. Lett. 257, 576 (1996).
9. R. Sen, B. C. Satishkumar, A. Govindaraj, K. R. Harikumar, G. Raina, J. P. Zhang, A. K. Cheetham, and C. N. R. Rao, Chem. Phys. Lett. 287, 671 (1998).
10. O. M. Kuttel, O. Groening, C. Emmenegger, and L. Schlapbach, Appl. Phys. Lett. 73, 2113 (1998).
11. K. H. Wu, E. G. G. Wang, C. Xu, and J. Qin, J. Appl. Phys. 83, 1702 (1998).
12. B. M. Novak, Adv. Mater. 5, 422 (1993).
13. XPS spectra were recorded from a VG ESCALAB MK2 system where the Mg Kα line was used as a reference. EELS experiments were performed on a dedicated (VG-HB501) scanning transmission electron microscope (STEM) operating at 100 kV, where a probe of diameter < 1 nm was used, allowing us to perform chemical analysis with nanometer scale.
14. J. Casanovas, J. M. Ricart, J. Rubio, F. Illas, and J. M. Jimenez Mateos, J. Am. Ceram. Soc. 118, 8071 (1996).
15. W. Z. Li, S. S. Xie, L. X. Qian, B. H. Chang, B. S. Zou, W. Y. Zhou, R. A. Zhao, and G. Wang, Science 274, 1701 (1996).
16. A. Krishnan, E. Dujardin, M. M. J. Treacy, J. Hugdahl, S. Lynum, and T. W. Ebbesen, Nature (London) 388, 451 (1997).
17. R. V. Latham, K. H. Bayliss, and B. M. Cox, J. Phys. D 19, 219 (1986).
18. N. S. Xu and R. V. Latham, J. Phys. D 19, 477 (1986).
19. Y. Saito, K. Hamaguchi, K. Hata, K. Uchida, Y. Tasaka, F. Ikazaki, M. Yumura, A. Kasuya, and Y. Nishina, Nature (London) 389, 554 (1997).
20. S. Fan, G. C. Michael, R. F. Nathan, W. T. Thomas, M. C. Alan, and H. Dai, Science 283, 512 (1999).