Stress-induced leakage current generation kinetics based on anode hole injection and hole dispersive transport

Journal of Applied Physics

Volumn 87, Issue 9 I, 2000, Pages 4626-4628

  Riess, P ^a   Ghibaudo, G ^a   Pananakakis, G ^a  

^a Grenoble INP Phelma   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000267418     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.373114     Document Type: Article

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