Understanding the improved performance of strained Si/Si1-xGex channel MOSFETs

Semiconductor Science and Technology

Volumn 12, Issue 12, 1997, Pages 1603-1608

  Roldan J B ^a   Gamiz F ^a   Lopez Villanueva J A ^a   Carceller, J E ^a  

^a UNIVERSITY OF GRANADA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000267379     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/12/12/010     Document Type: Article

References (17)

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