Switching of deep levels in CuInSe2 due to electric field-induced Cu ion migration

Journal of Applied Physics

Volumn 84, Issue 8, 1998, Pages 4322-4326

  Nadazdy V ^a   Yakushev, M ^b   Djebbar, E H ^b   Hill, A E ^b   Tomlinson, R D ^b  

^a INSTITUTE OF PHYSICS   (Slovakia)

^b UNIVERSITY OF SALFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000240848     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368651     Document Type: Article

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