Sources and control of instrumental drift in the surface forces apparatus

Review of Scientific Instruments

Volumn 71, Issue 12, 2000, Pages 4502-4508

  Heuberger, M ^a   Zach M ^a   Spencer, N D ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000197962     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1319977     Document Type: Article

References (14)

1. A. Tonck, J. M. Georges, and J. L. Loubet, J. Colloid Interface Sci. 126, 150 (1988).
2. P. Frantz, N. Agrait, and M. Salmeron, Langmuir 12, 3289 (1996).
3. P. Frantz, A. Artsyukhovich, R. W. Carpick, and M. Salmeron, Langmuir 13, 5957 (1997).
4. M. Zäch and M. Heuberger, Langmuir 16, 7309 (2000).
5. M. Heuberger (in preparation).
6. S. Tolansky, Multiple Beam Interferometry of Surfaces and Films (Oxford University Press, Oxford, 1948).
7. M. T. Clarkson, J. Phys. D 22, 475 (1989).
8. M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, Oxford, 1980).
9. J. N. Israelachvili, J. Colloid Interface Sci. 44, 259 (1973).
10. J. Vanicek et al. (in preparation).
11. Dupont, Properties Handbook, Teflon® PTFE, Report No H-37051-1.
12. J. N. Israelachvili, U.S. Patent No. 5,861,954 (1999), p. 25.
13. W. Steinhilper and R. Röper, Verbindungselemente, 3rd ed. (Springer, Berlin, 1993).
14. C. W. Wegst, Key to Steel, 17th ed. (Stahlschüssel Wegst GmbH, 1995).