Statistical and systematic errors of the surface forces apparatus

Langmuir

Volumn 16, Issue 18, 2000, Pages 7309-7314

  Zach M ^a   Heuberger, M ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DISTANCE MEASUREMENT; INSTRUMENT ERRORS; MEASUREMENT ERRORS; OPTICAL VARIABLES MEASUREMENT; REFRACTIVE INDEX; SURFACES;

SURFACE FORCE; SURFACE FORCES APPARATUS; SYSTEMATIC ERROR;

INTERFEROMETRY;

EID: 0040034804     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0003387     Document Type: Article

References (18)

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18. Note: scanning probe microscopes operate on different time scales and k/R ratios. The presence of an active feedback-loop and the fact that the spring deflection is directly measured presents a situation different from that in the SFA.