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Volumn 9, Issue 3, 1999, Pages 230-235

Determination of the elastic modulus of thin film materials using self-deformed micromachined cantilevers

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[No Author keywords available]

Indexed keywords


EID: 0000168554     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/9/3/303     Document Type: Article
Times cited : (67)

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    • Najafi K and Suzuki K 1989 A novel technique and structure for the measurement of intrinsic stress and Young's modulus of thin films Proc. IEEE/MEMS (Salt Lake City, UT, February 1989) pp 96-7
    • (1989) Proc. IEEE/MEMS (Salt Lake City, UT, February 1989) , pp. 96-97
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    • Tai, Y.-C.1    Muller, R.S.2
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    • Measurement of the mechanical properties of silicon microresonators
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    • Measurement of Young's modulus and internal stress in silicon microresonators using a resonant frequency technique
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.