Pixel-based absolute topography test for three flats

Applied Optics

Volumn 37, Issue 25, 1998, Pages 5951-5956

  Parks, Robert E ^a,b   Shao, Lianzhen ^c   Evans, Chris J ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b Optical Perspectives Group LLC   (United States)

^c Tucson Optical Research Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000151217     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.005951     Document Type: Article

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