In-situ measurements of shapes and thicknesses of optical parts by femtosecond two-colour interferometry

Optics Communications

Volumn 138, Issue 1-3, 1997, Pages 6-10

  Minoshima, Kaoru ^a   Matsumoto, Hirokazu ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Common path interferometer; Femtosecond; In situ measurement; Shape and thickness measurements; Two colour interferometry; Ultrashort

Indexed keywords

INTERFEROMETRY; LASER PULSES; SURFACE MEASUREMENT; THICKNESS MEASUREMENT;

COMMON PATH INTERFEROMETER; FEMTOSECOND TWO COLOR INTERFEROMETRY (FTI);

OPTICAL INSTRUMENT LENSES;

EID: 0031139758     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(97)00029-1     Document Type: Article

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