Measurement of the effects of the localized field of a magnetic force microscope tip on a 180° domain wall

Journal of Applied Physics

Volumn 81, Issue 8 PART 2B, 1997, Pages 5032-5034

  Foss, Sheryl ^a   Dahlberg, E Dan ^a   Proksch, Roger ^a,c   Moskowitz, Bruce M ^b  

^a University of Minnesota   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

^c ST OLAF COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000100526     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364500     Document Type: Article

References (24)

1. Y. Martin and H. K. Wickramasinghe, Appl. Phys. Lett. 50, 1455 (1987).
2. U. Hartmann, J. Appl. Phys. 64, 1561 (1988).
3. J. R. Barnes, S. J. O'Shea, and M. E. Welland, J. Appl. Phys. 76, 418 (1994).
4. S. Manalis, K. Babcock, J. Massie, V. Elings, and M. Dugas, Appl. Phys. Lett. 66, 2585 (1995).
5. H. J. Mamin, D. Rugar, J. E. Stern, R. E. Fontana, Jr., and P. Kasiraj, Appl. Phys. Lett. 55, 318 (1989).
6. W. Rave, L. Belliard, M. Labrune, A. Thiaville, and J. Miltat, IEEE Trans. Magn. 30, 4473 (1994).
7. M. R. Scheinfein, J. Unguris, D. T. Pierce, and R. J. Celotta, J. Appl. Phys. 67, 5932 (1990).
8. A. Aharoni and J. P. Jakubovics, J. Appl. Phys. 73, 6498 (1993).
9. S. Müller-Pfeiffer, M. Schneider, and W. Zinn, Phys. Rev. B 49, 15 745 (1994).
10. W. Williams, V. Hoffmann, F. Heider, T. Göddenhenrich, and C. Heiden, Geophys. J. Int. 111, 417 (1992).
11. R. Proksch, S. Foss, and E. D. Dahlberg, IEEE Trans. Magn. 30, 4467 (1994).
12. S. Foss, R. Proksch, E. D. Dahlberg, B. M. Moskowitz, and B. Walsh, Appl. Phys. Lett. 69, 3426 (1996).
13. D. G. Streblechenko, M. R. Scheinfein, M. Mankon, and K. Babcock, IEEE Trans. Magn. 32, 4124 (1996).
14. U. Hartmann, T. Gödenhenrich, and C. Heiden, J. Magn. Magn. Mater. 101, 263 (1991).
15. Ö. Özdemir and D. Dunlop, Geophys. Res. Lett. 20, 1835 (1993).
16. S. Xu and D. Dunlop, Geophys. Res. Lett. 23, 2819 (1996).
17. A. E. Labonte, J. Appl. Phys. 40, 2450 (1969).
18. Q. Zhong, D. Inniss, K. Kjoller, and V. Elings, Surf. Sci. 290, L688 (1993): R. Giles, J. P. Cleveland, S. Manne, P. K. Hansma, B. Drake, P. Maivald, C. Boles, J. Gurley, and V. Elings, Appl. Phys. Lett. 63, 617 (1993).
19. Q. Zhong, D. Inniss, K. Kjoller, and V. Elings, Surf. Sci. 290, L688 (1993): R. Giles, J. P. Cleveland, S. Manne, P. K. Hansma, B. Drake, P. Maivald, C. Boles, J. Gurley, and V. Elings, Appl. Phys. Lett. 63, 617 (1993).
20. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys. 61, 4723 (1987).
21. Nanoprobe™ SPM tips from Digital Instruments of Santa Barbara, CA coated with a 40-nm-thick CoCr alloy thin film as described in K. Babcock, V. Elings, M. Dagas, and S. Loper, IEEE Trans. Magn. 30, 4503 (1995).
22. R. Proksch, G. Skidmore, E. D. Dahlberg, S. Foss, J. Schmidt, C. Merton, B. Walsh, and M. Dugas, Appl. Phys. Lett. 69, 2599 (1996).
23. H. J. Mamin, D. Rugar, J. E. Stern, B. D. Terris, and S. E. Lambert, Appl. Phys. Lett. 53, 1446 (1988).
24. Definition of the center of the DW was different for each type of profile measurement: however, care was taken to remain over the same area of the DW for both tip magnetization states using the topography of the area. Furtherore, as profiles were measured repeatedly over the same line, a measure of the lateral drift with time was made and accounted for in aligning the two profiles for calculation of the diference profile.