Surface analysis of oligothiophene films using HREELS: molecular orientation effects

Advanced Materials for Optics and Electronics

Volumn 9, Issue 5, 1999, Pages 211-218

  Rei Vilar, M ^a   Horowitz, G ^a   Lang, P ^a   Pellegrino, O ^b   Botelho Do Rego, A M ^b  

^a CNRS   (France)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; ELECTRON ENERGY LOSS SPECTROSCOPY; INFRARED SPECTROSCOPY; IONIZATION; LIGHT ABSORPTION; LIGHT REFLECTION; MOLECULAR ORIENTATION; MOLECULAR VIBRATIONS; RELAXATION PROCESSES; SUBSTRATES; SULFUR COMPOUNDS; SURFACE PHENOMENA;

ELECTRON IMPACT; ELECTRON SURFACE INTERACTION; HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY; OLIGOTHIOPHENE; QUATERTHIOPHENE; QUINQUETHIOPHENE; REFLECTION ABSORPTION INFRARED SPECTROSCOPY; SEXITHIOPHENE;

PLASTIC FILMS;

EID: 0000086161     PISSN: 10579257     EISSN: None     Source Type: Journal    
DOI: 10.1002/1099-0712(199909/10)9:5<211::AID-AMO384>3.0.CO;2-G     Document Type: Article

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