Characterization of oligothiophenefilms by high resolution electron energy loss spectroscopy

Thin Solid Films

Volumn 327-329, Issue 1-2, 1998, Pages 252-255

  Pellegrino, O ^a   Rei Vilar, M ^b   Horowitz, G ^b   Kouki, F ^b   Garnier, F ^b   Lopes Da Silva, J D ^a   Botelho Do Rego, A M ^a  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b CNRS   (France)

Author keywords

Conducting polymers; High resolution aectron energy loss spectroscopy; Resonances; Thiophenes; Triplet states

Indexed keywords

CONDUCTIVE PLASTICS; DEPOSITION; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY GAP; EVAPORATION; INFRARED SPECTROSCOPY; IONIZATION OF SOLIDS; MOLECULAR VIBRATIONS; PHASE TRANSITIONS; POLYCRYSTALLINE MATERIALS; RAMAN SCATTERING;

DIFFERENTIAL CROSS SECTION ANALYSIS; HIGH RESOLUTION ELECTRON ENERGY LOSS SPECTROSCOPY (HREELS); OLIGOTHIOPHENE FILMS;

PLASTIC FILMS;

EID: 0345765236     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(98)00639-7     Document Type: Article

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