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Thin Solid Films

Volumn 286, Issue 1-2, 1996, Pages 98-106

Highly oriented polytetrafluoroethylene films: A force microscopy study

(2) Bodo P a,b Schott, M a

a CNRS (France)

b IMC (Sweden)

Author keywords

Atomic force microscopy; Deposition process; Polymers; Surface morphology

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; FILM GROWTH; MORPHOLOGY; POLYTETRAFLUOROETHYLENES; THIN FILMS;

HIGHLY ORIENTED FILMS; MOLECULAR RESOLUTION; PLASTIC FILM SUBSTRATES;

PLASTIC FILMS;

EID: 0030233006 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(95)08529-7 Document Type: Article

Times cited : (16)

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