Time-of-flight SIMS and in-situ XPS study of O2 and O2-N2 post-discharge microwave plasma-modified high-density polyethylene and hexatriacontane surfaces

Journal of Adhesion Science and Technology

Volumn 10, Issue 11, 1996, Pages 1165-1197

  Leonard, D ^a   Bertrand, P ^a   Scheuer, A ^b   Prat, R ^b   Hommet, J ^b   Le Moigne, J ^b   Deville, J P ^b  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

^b INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

Degradation; Functionalization; Gas mixture; HDPE; Hexatriacontane; In situ XPS; Microwave discharge; N2; O2; Oxygen atom role; Post discharge plasma treatment; ToF SIMS

Indexed keywords

COMPOSITION EFFECTS; HIGH DENSITY POLYETHYLENES; NITROGEN; OXYGEN; PLASMA APPLICATIONS; SECONDARY ION MASS SPECTROMETRY; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY; ATOMS; DEGRADATION; DESORPTION; GAS MIXTURES; MICROWAVES; MOLECULAR OXYGEN; NITROGEN PLASMA; PLASMA THEORY; THERMOPLASTICS;

HEXATRIACONTANE (HTC); HIGH DENSITY POLYETHYLENE (HDPE); OXYGEN ATOM RECOMBINATION PROCESS; OXYGEN CONTAINING FRAGMENTS; PLASMA GAS; POST DISCHARGE MODELING;

SURFACE TREATMENT; ELECTRIC DISCHARGES;

FUNCTIONALIZATIONS; HEXATRIACONTANE; IN-SITU; MICROWAVE DISCHARGE; OXYGEN ATOM ROLE; POST-DISCHARGE; TOF SIMS;

EID: 0030383758     PISSN: 01694243     EISSN: 15685616     Source Type: Journal    
DOI: 10.1163/156856196X00184     Document Type: Article

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