Peierls or Jahn-Teller effect in endohedrally doped silicon clathrates: An EXAFS study

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 24, 2000, Pages 16550-16560

  Brunet, F ^a   Melinon P ^a   San Miguel, A ^a   Keghelian P ^a   Perez, A ^a   Flank, A ^b  

^a UNIVERSITÉ LYON 1   (France)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000079847     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.16550     Document Type: Article

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