Electron density profile measurement using an ultrashort-pulsed radar reflectometer on large helical device

Review of Scientific Instruments

Volumn 75, Issue 10 II, 2004, Pages 3846-3848

  Kaneba, T ^a   Tokuzawa, T ^b   Kawahata, K ^b   Ito, Y ^b   Nagayama, Y ^b  

^a GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^b NATIONAL INSTITUTE FOR FUSION SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); BANDWIDTH; CARRIER CONCENTRATION; ELECTROMAGNETIC WAVES; HELICAL ANTENNAS; INFRARED RADIATION; NATURAL FREQUENCIES; SIGNAL PROCESSING; ULTRASHORT PULSES;

FAR-INFRARED (FIR) INTERFEROMETER; LARGE HELICAL DEVICE (LHD); TIME-OF-FLIGHT (TOF); ULTRASHORT-PULSED RADAR REFLECTOMETER (USPR);

REFLECTOMETERS;

EID: 9944255359     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1790071     Document Type: Conference Paper

References (7)

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