Ultrashort pulse reflectometry for density profile and fluctuation measurements on SSPX

Review of Scientific Instruments

Volumn 74, Issue 3 II, 2003, Pages 1518-1521

  Roh, Y ^a,b   Domier, C W ^a   Luhmann Jr , N C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Soongsil University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BANDPASS FILTERS; FREQUENCIES; MILLIMETER WAVES; MONITORING; REFLECTOMETERS; SIGNAL TO NOISE RATIO; ULTRASHORT PULSES;

DENSITY PROFILE;

PLASMAS;

EID: 0037351933     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1527254     Document Type: Conference Paper

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