Optical constants and degradation studies of diphenyl and methylphenyl polysilane copolymer using ellipsometry

Synthetic Metals

Volumn 147, Issue 1-3, 2004, Pages 139-142

  Sharma, Asha ^a   Katiyar, Monica ^a   Deepak, ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

Energy range; Optical constant; Spectroscopic ellipsometry

Indexed keywords

COPOLYMERS; ELLIPSOMETRY; LIGHT EMITTING DIODES; POLYMERS; REFRACTIVE INDEX; SILICON; THIN FILMS;

ENERGY RANGE; OPTICAL CONSTANT; POLYMER LIGHT EMITTING DIODES (PLED); SPECTROSCOPIC ELLIPSOMETRY;

POLYSILANES;

EID: 9944253209     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2004.06.055     Document Type: Conference Paper

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