Temperature dependence of ellipsometric spectra of poly(methyl- phenylsilane)

Thin Solid Films

Volumn 455-456, Issue , 2004, Pages 278-282

  Zrzavecká, O Bonaventurová ^a   Nebojsa, A ^a   Navratil K ^a   Nespurek S ^b   Humlicek J ^a  

^a MASARYK UNIVERSITY   (Czech Republic)

^b INSTITUTE OF MACROMOLECULAR CHEMISTRY   (Czech Republic)

Author keywords

Ellipsometric spectra; Poly(methyl phenylsilane); Temperature

Indexed keywords

ANNEALING; BAND STRUCTURE; ELLIPSOMETRY; EXCITONS; OPTICAL PROPERTIES; SPECTRUM ANALYSIS; THIN FILMS; ULTRAVIOLET RADIATION;

ELLIPSOMETRIC SPECTRA; EXCITONIC BANDS; POLY(METHYL-PHENYLSILANE); TEMPERATURE SHIFT;

ORGANIC POLYMERS;

EID: 2142709483     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2004.01.012     Document Type: Conference Paper

References (7)

1. Matsumoto N. Jpn. J. Appl. Phys. 37:1998;5425.
2. Navrátil K., Šik J., Humlíček J., Nešpůrek S. Opt. Mater. 12:1999;105.
3. Nešpůrek S. J. Non-Cryst. Solids. 299:2002;1033.
4. Kamata N., Aihara S., Ishizaka W., Umeda M., Terunuma D., Yamada K., Furukawa S. J. Non-Cryst. Solids. 227-230:1998;538-542.
5. Nešpůrek S. Mater. Sci. Eng. C. 8-9:1999;19-36.
6. Šik J., Hora J., Humlíček J. J. Appl. Phys. 84:1998;6291.
7. Humlíček J., Garriga M. Temperature dependence of the optical spectra of SiGe alloys. Pantelides S.T., Zollner S. Silicon-Germanium Carbon Alloys. 2002;Taylor and Francis, New York.