Structural and electronic features important to nπ*- ππ* inversion sensors: Synthesis, luminescence, and electrochemical properties of sulfur and chlorine-containing macrocycles. Part 3

Tetrahedron

Volumn 61, Issue 2, 2005, Pages 479-484

  Kadarkaraisamy, Mariappan ^a   Dufek, Eric ^a   Elk, Desire Lone ^a   Sykes, Andrew G ^a  

^a W O Farber Center for Civic Leadership   (United States)

Author keywords

Anthraquinone; Luminescence; Sensors

Indexed keywords

CHLORINE; MACROCYCLIC COMPOUND; SULFUR;

ARTICLE; BINDING SITE; CHEMICAL BINDING; CHEMICAL REACTION; CHEMICAL STRUCTURE; ELECTROCHEMICAL ANALYSIS; ELECTRONICS; LUMINESCENCE; PRIORITY JOURNAL; REACTION ANALYSIS; SENSOR; STRUCTURE ANALYSIS; SYNTHESIS;

EID: 9744232960     PISSN: 00404020     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tet.2004.10.047     Document Type: Article

References (19)

1. V.G. Young Jr., H.L. Quiring, and A.G. Sykes J. Am. Chem. Soc. 119 1997 12477
2. B. Kampmann, Y. Lian, K.L. Klinkel, P.A. Vecchi, H.L. Quiring, C.C. Soh, and A.G. Sykes J. Org. Chem. 67 2002 3878
3. V.G. Young Jr., and A.G. Sykes Inorg. Chem. 37 1998 376
4. A.P. de Silva, H.Q.N. Gunaratne, T. Gunnlaugsson, A.J.M. Huxley, C.P. McCoy, J.T. Rademacher, and T.E. Rice Chem. Rev. 97 1997 1515 and references within
5. K. Kalyanasundaram, and J.K. Thomas J. Phys. Chem. 81 1977 2176
6. P. Lianos, B. Lux, and D.J. Gerald Chim. Phys. 77 1988 907
7. H. Zollinger Color Chemistry 1991 VCH 209
8. W. Nakanishi, S. Hayashi, and N. Itoh Chem. Commun. 2003 124
9. Z. Chen, O. Schall, M. Alcala, Y. Li, G.W. Gokel, and L. Echegoyen J. Am. Chem. Soc. 114 1992 444
10. H. Kim, O.F. Schall, J. Fang, J.E. Trafton, T. Lu, J.L. Atwood, and G.W. Gokel J. Phys. Org. Chem. 5 1992 482
11. M. Delgado, D.A. Gustowski, H.K. Yoo, V.J. Gatto, G.W. Gokel, and L. Echegoyen J. Am. Chem. Soc. 110 1988 119
12. F. Tisato, T. Maina, L. Shao, M.J. Heeg, and E. Deutsch J. Med. Chem. 39 1996 1253
13. T.J. Meyer, and G. Crosby J. Am. Chem. Soc. 97 1975 7031
14. WinGX: an integrated system of windows programs for the solution, refinement, and analysis of single crystal X-ray diffraction data, Ver. 1.63 L.J. Farrugia J. Appl. Cryst. 32 1999 837
15. An empirical correction for absorption anisotropy, R. Blessing Acta Cryst. A51 1995 33
16. SAINT V6.2, Bruker Analytical X-ray Systems, Madison, WI, 2001.
17. SHELXTL V6.10, Bruker Analytical X-ray Systems, Madison, WI, 2000.
18. α radiation, (=0.71073; Siemens CCD area detector diffractometer; R=0.08140, wR2=0.2328. Additional crystallographic data is also provided in the supplemental material (Table S1). CCDC # 246678.
19. α radiation, λ=0.71073; Nonius CAD4 diffractometer; R=0.0620, wR2=0.1074. Additional crystallographic data is also provided in the supplemental material (Table S1). CCDC # 246677.