Surface features of P-doped silica: A comparison between IR spectroscopy and theoretical modelling

Journal of Materials Chemistry

Volumn 14, Issue 22, 2004, Pages 3364-3369

  Cerruti, Marta ^a   Morterra, Claudio ^a   Ugliengo, Piero ^a  

^a UNIVERSITY OF TURIN   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CONDENSATION; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN BONDS; INFRARED SPECTROSCOPY; LIME; SEMICONDUCTOR DOPING;

BIOACTIVE GLASSES; CLUSTER MODELS; THERMAL TREATMENTS; WATER ADSORPTION;

SILICA;

CALCIUM OXIDE; GLASS; PYROPHOSPHATE; SILICON DIOXIDE;

AB INITIO CALCULATION; ARTICLE; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; HIGH TEMPERATURE PROCEDURES; HYDROGEN BOND; INFRARED SPECTROSCOPY; STRUCTURE ANALYSIS; SURFACE PROPERTY; TEMPERATURE DEPENDENCE; THERMAL ANALYSIS;

EID: 9644303197     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/b407242a     Document Type: Article

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