Optical study of cobalt nanocrystals implanted into silica matrix by spectroscopic ellipsometry

Superlattices and Microstructures

Volumn 36, Issue 1-3, 2004, Pages 161-169

  Gilliot, M ^a   En Naciri, A ^a   Johann, L ^a   D'Orleans, C ^b   Muller, D ^b   Stoquert, J P ^b   Grob, J J ^b  

^a Lab Phys Liquides et Interfaces   (France)

^b Faculté de Médecine   (France)

Author keywords

Cobalt nanocrystals; Drude model; Ellipsometry; Maxwell Garnett; Optical properties

Indexed keywords

COBALT; CRYSTALLINE MATERIALS; ELLIPSOMETRY; ENERGY ABSORPTION; ION IMPLANTATION; OPTICAL PROPERTIES; SILICA; THICKNESS MEASUREMENT; VOLUME FRACTION;

DIELECTRIC FUNCTIONS; METAL TRANSITIONS; NANOCRYSTALS; OPTICAL CONSTANTS;

NANOSTRUCTURED MATERIALS;

EID: 9644275716     PISSN: 07496036     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.spmi.2004.08.016     Document Type: Article

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