Charge density study under high pressure

Journal of Physics and Chemistry of Solids

Volumn 65, Issue 12, 2004, Pages 1973-1976

  Sakata, Makoto ^a   Itsubo, Takafumi ^a   Nishibori, Eiji ^a   Moritomo, Yutakata ^a   Kojima, Norimichi ^b   Ohishi, Yasuo ^c   Takata, Masaki ^c  

^a NAGOYA UNIVERSITY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c Japan Synchrotron Research Institute   (Japan)

Author keywords

C. High pressure; C. X ray diffraction; D. Crystal structure; D. Electronic structure

Indexed keywords

ABSORPTION; CARRIER CONCENTRATION; CHEMICAL BONDS; CRYSTAL STRUCTURE; ELECTRONIC STRUCTURE; LATTICE CONSTANTS; OSCILLATIONS; PARTICLE SIZE ANALYSIS; PHASE TRANSITIONS; RAMAN SCATTERING; SYNCHROTRONS; X RAY POWDER DIFFRACTION;

CHARGE DENSITY; COVALENT BONDS; ELECTRONIC PHASE TRANSITION; NETWORK STRUCTURE;

HIGH PRESSURE EFFECTS;

EID: 9544224170     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2004.08.028     Document Type: Conference Paper

References (4)

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3. M. Takata, E. Nishibori, M. Sakata, Z. Kristallogr. 216 (2001) 71-86.
4. H. Tanaka, M. Takata, E. Nishibori, K. Kato, T. Iishi, M. Sakata, J. Appl. Cryst. 35 (2002) 282-286.