Characterization of ceramic oxide refractories by XRF and XRD

X-Ray Spectrometry

Volumn 33, Issue 6, 2004, Pages 421-430

  Gazulla, M F ^a   Gomez M P ^a   Barba, A ^a   Jarque, J C ^a  

^a UNIVERSITAT JAUME I   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; CERAMIC MATERIALS; MAGNESIA; SILICA; X RAY DIFFRACTION;

CERAMIC OXIDES; CHEMICAL CHARACTERIZATION; DIFFRACTION ANALYSIS; PHASE ANALYSIS; PROPERTY; REFERENCE MATERIAL; SILICA-ALUMINA; X RAY FLUORESCENCE; X RAY FLUORESCENCE ANALYSIS; X RAY FLUORESCENCE SPECTROMETRY;

REFRACTORY MATERIALS;

EID: 9444230471     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/xrs.743     Document Type: Conference Paper

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