Determination of components in refractories containing zirconia by x-ray fluorescence spectrometry

X-Ray Spectrometry

Volumn 29, Issue 6, 2000, Pages 418-425

  Asakura, Hideo ^a   Ikegami, Katsusige ^a   Murata, Mamoru ^b   Wakita, Hisanobu ^c  

^a Shinagawa Refractories Co Ltd   (Japan)

^b NARUTO UNIVERSITY OF EDUCATION   (Japan)

^c FUKUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ATOMIC EMISSION SPECTROSCOPY; CALIBRATION; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; HAFNIUM OXIDES; INDUCTIVELY COUPLED PLASMA; REFRACTORY MATERIALS; SILICA; SPECTROMETRY; ZIRCON;

ALUMINA-SILICA; ALUMINA-ZIRCONIA; CALIBRATION CURVES; INDUCTIVELY COUPLED PLASMA ATOMIC EMISSION SPECTROMETRY; INDUCTIVELY COUPLED PLASMA ATOMIC-EMISSION SPECTROMETRIES; INDUCTIVELY COUPLED PLASMA-ATOMIC EMISSION SPECTROMETRY; JAPANESE INDUSTRIAL STANDARDS; METHODS OF ANALYSIS; REFERENCE MATERIAL; X RAY FLUORESCENCE SPECTROMETRY;

ZIRCONIA;

EID: 0034368018     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/1097-4539(200011/12)29:6<418::AID-XRS445>3.0.CO;2-P     Document Type: Article

References (14)

1. Refractories Handbook. Technical Association of Refractories, Japan: Tokyo, 1998.
2. Asakura H, Yamada Y, Wakita H. Adv. X-Ray Chem. Anal. Jpn. 1999;30:73.
3. -1998. 1998.
4. -1998. 1998.
5. Bennett H, Reed RA. Chemical Method of Silicate Analysis. A Handbook. Academic Press: London, 1971; 136.
6. Nishina T, Mihashi H, Asakura H. Refract. Jpn. 1994; 46: 253.
7. Nishina T, Mihashi H, Murata M, Asakura H. Taikabutsu Overseas 1994; 14(3): 10.
8. -1995. 1995.
9. Lachance GR, Claisse F. Quantitative X-Ray Fluorescence Analysis, Theory and Application. John Wiley & Sons: Chichester, 1995.
10. Laguitton D, Mantler M. Adv. X-Ray Anal. 1977; 20: 515.
11. Ohono K, Kawase T, Nakamura T. Techniques of X-Ray Analysis. Kyoritsu: Tokyo, 1987.
12. Cooperation Data No. 431/Results of Cooperation Using X-Ray Fluorescence Analysis. Chemical Analysis Subcommittee of the Technical Association of Refractories, Japan: Tokyo, 8 November 1996.
13. Cooperation Data No. 475/Results of Cooperation Using X-Ray Fluorescence Analysis. Chemical Analysis Subcommittee of the Technical Association of Refractories, Japan: Tokyo, 12 September 1997.
14. ISO/FDIS12677, Chemical Analysis of Refractory Products by XRF/Fused Cast Bead Method, ISO/FDIS12667. International Standards Organization: Geneva, 1999.