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Volumn 95, Issue 11, 2004, Pages 1011-1019

Evolution of microstructure during creep in gamma Ti-52Al at 1100 K and high applied stresses

Author keywords

Creep; Intermetallics; Titanium aluminides; Transmission electron microscopy

Indexed keywords

ALUMINUM; CREEP TESTING; DEFORMATION; INTERMETALLICS; METALLOGRAPHY; MICROSTRUCTURE; STRESS ANALYSIS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 9244264986     PISSN: 00443093     EISSN: None     Source Type: Journal    
DOI: 10.3139/146.018049     Document Type: Article
Times cited : (3)

References (40)
  • 22
    • 85039469325 scopus 로고    scopus 로고
    • PhD thesis, Masaryk University Brno, Brno
    • M. Kvapilová: PhD thesis, Masaryk University Brno, Brno (2000).
    • (2000)
    • Kvapilová, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.