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Volumn 95, Issue 11, 2004, Pages 1011-1019
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Evolution of microstructure during creep in gamma Ti-52Al at 1100 K and high applied stresses
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Author keywords
Creep; Intermetallics; Titanium aluminides; Transmission electron microscopy
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Indexed keywords
ALUMINUM;
CREEP TESTING;
DEFORMATION;
INTERMETALLICS;
METALLOGRAPHY;
MICROSTRUCTURE;
STRESS ANALYSIS;
THERMAL EFFECTS;
TRANSMISSION ELECTRON MICROSCOPY;
CREEP RATES;
SUPERDISLOCATIONS;
TITANIUM ALUMINIDES;
TITANIUM;
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EID: 9244264986
PISSN: 00443093
EISSN: None
Source Type: Journal
DOI: 10.3139/146.018049 Document Type: Article |
Times cited : (3)
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References (40)
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