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Volumn 43, Issue 9 A, 2004, Pages 6335-6341
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In-situ optical spectroscopy of ablation plume for preparations of nanostructured TiO2 thin films by pulsed laser deposition
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Author keywords
In situ optical spectroscopy; Laser ablation; Nanostructures; Narrow band photometry; Surface morphology; Titanium dioxide
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTAL STRUCTURE;
ENERGY GAP;
MORPHOLOGY;
NANOSTRUCTURED MATERIALS;
PHOTOMETRY;
PULSED LASER DEPOSITION;
SPECTROSCOPY;
SUBSTRATES;
TITANIUM DIOXIDE;
X RAY DIFFRACTION;
CONTROL PARAMETERS;
IN-SITU OPTICAL SPECTROSCOPY;
MELTING POINT;
NARROW-BAND PHOTOMETRY;
THIN FILMS;
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EID: 9244237065
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/JJAP.43.6335 Document Type: Article |
Times cited : (17)
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References (33)
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