Parylene protection coatings for thin film V[TCNE]x room temperature magnets

Chemistry of Materials

Volumn 16, Issue 24, 2004, Pages 5114-5119

  Pokhodnya, Konstantin I ^a,b   Bonner, Michael ^a   Miller, Joel S ^a  

^a UNIVERSITY OF UTAH   (United States)

^b OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DEGRADATION; GOLD; MAGNETIC FILMS; THIN FILMS;

CONDUCTIVITY DEGRADATION; PARYLENE; ROOM TEMPERATURE; V[TCNE]X;

COATINGS;

GOLD; OXYGEN; PARACYCLOPHANE DERIVATIVE; PARYLENE; TETRACYANOETHYLENE; UNCLASSIFIED DRUG; WATER;

ARTICLE; CONDUCTANCE; FILM; MAGNET; MAGNETISM; MATERIAL COATING; POLYMERIZATION; ROOM TEMPERATURE; VAPOR;

EID: 9244227997     PISSN: 08974756     EISSN: None     Source Type: Journal    
DOI: 10.1021/cm048872d     Document Type: Article

References (13)

1. (a) Wolf, S. A. J. Supercond. 2000, 13, 195.
2. (b) Prinz, G. Science 1998, 282, 1660. Ohno, H.; Matsukura, F. Solid State Commun. 2001, 117, 179.
3. (b) Prinz, G. Science 1998, 282, 1660. Ohno, H.; Matsukura, F. Solid State Commun. 2001, 117, 179.
4. Prigodin, V. N.; Raju, N. P.; Pokhodnya, K. I.; Miller, J. S.; Epstein, A. J. Adv. Mater. 2002, 14, 1230.
5. c below room temperature.
6. Pokhodnya, K. I.; Epstein, A. J.; Miller, J. S. Adv. Mater. 2000, 12, 410.
7. (a) M. Szwarc and Union Carbide Corporation. US Patents 3288728, 2341754, 637651, 650947, 740886, 883939, 973901, 11120422, 1112894, 1428168.
8. (b) Szwarc, M. S. Polym. Eng. Sci. 1976, 16, 473.
9. The average molecular weight of the Parylene polymer is 31 288 assuming that the degree of polymerization is 2000-4000.
10. Su, Y. O.; Czernuszewicz, R. S.; Miller, L. A.; Spiro T. G. J. Am. Chem. Soc. 1988, 110, 4150.
11. Decker, W.; Henry, B. Basic Principles of Thin-Film Barrier Coatings. In Proceedings of the 45th Annual Technical Conference of the Society of Vacuum Coaters, Orlando, Florida, 2002; p 492.
12. Ag, Al, or other low melting point metals should also be effective.
13. Pokhodnya K. I.; Epstein A. J.; Miller J. S. Bull. Am. Phys. Soc. 2004, 49, Part II, 846.