Compositional profiles in silica-based sol-gel films doped with erbium and silver, by RBS and ERDA

Journal of Sol-Gel Science and Technology

Volumn 31, Issue 1-3 SPEC.ISS., 2004, Pages 287-291

  Marques, A C ^a   Almeida, R M ^a   Ramos, A R ^b,c   Alves, E ^b,c  

^a INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^b INSTITUTO TECNOLÓGICO E NUCLEAR   (Portugal)

^c UNIVERSITY OF LISBON   (Portugal)

Author keywords

Erbium doped waveguides; RBS ERDA studies; Silica titania films; Silver doped waveguides

Indexed keywords

BACKSCATTERING; DATA REDUCTION; ERBIUM; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HEAT TREATMENT; HYDROGEN; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON COMPOUNDS; SILVER; ULTRAVIOLET SPECTROSCOPY; WAVEGUIDES;

ERBIUM-DOPED WAVEGUIDES; RBS/ERDA STUDIES; SILICA-TITANIA FILMS; SILICON SURFACE BARRIER (SSB); SILVER-DOPED WAVEGUIDES;

SOL-GELS;

EID: 9244225148     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:JSST.0000048005.33044.8b     Document Type: Article

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