Near-linear CMOS I/O driver with less sensitivity to process, voltage, and temperature variations

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 12, Issue 11, 2004, Pages 1253-1257

  Esch Jr , Gerald ^a   Chen, Tom ^b  

^a AGILENT TECHNOLOGIES   (United States)

^b Department of Mechanical Engineering   (United States)

Author keywords

Driver output impedance matching; I O performance; Process variation; Programmable I O driver

Indexed keywords

COMPUTER ARCHITECTURE; ELECTRIC RESISTANCE; ERROR DETECTION; FIELD EFFECT TRANSISTORS; IMPEDANCE MATCHING (ELECTRIC); INPUT OUTPUT PROGRAMS; VOLTAGE CONTROL;

DRIVER OUTPUT IMPEDANCE MATCHING; I/O PERFORMANCE; PROCESS VARIATION; PROGRAMMABLE I/O DRIVER;

CMOS INTEGRATED CIRCUITS;

EID: 9244225129     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2004.836321     Document Type: Article

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