Low temperature single crystal X-ray diffraction: Advantages, instrumentation and applications

Chemical Society Reviews

Volumn 33, Issue 8, 2004, Pages 490-500

  Goeta, A E ^a   Howard, J A K ^a  

^a DURHAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; ELECTRICITY; INSTRUMENTATION; LOW TEMPERATURE; MOLECULAR DYNAMICS; PHYSICAL CHEMISTRY; REVIEW; X RAY DIFFRACTION;

EID: 9144240440     PISSN: 03060012     EISSN: 14604744     Source Type: Journal    
DOI: 10.1039/b312763j     Document Type: Article

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